Murata Gate Drive DC/DC Converter TestingFollow article
This report details the work done and results for the project Phase 1 - DCDC Insulation Degradation. The project was to investigate the insulation of DC/DC converters to dV/dt stress for devices designed for use in power electronic converters, namely the MGJ2, MGJ3 and MGJ6 devices.
During the early phase, the project aimed to assess the possibilities of detecting potential isolation degradation and failure by the use of 3d-xray tomography taken at intervals during dV/dt stress testing of MGJ2 devices.
The latter phase would initially be used to perform extended dV/dt testing on MGJ2 devices for SiC MOSFET devices. MGJ3 and MGJ6 devices are tested under similar conditions to the MGJ2 devices, using both IGBT and SiC MOSFET devices.
The extended testing phase is to build confidence in the DC/DC converters under more difficult switching conditions compared to more conventional switching speeds.
The report is structured thus:
- dV/dt experimental testing platform
- 3D-Xray tomography tests
- dV/dt Testing
3.1) MGJ2 for SiC dV/dt Experimental tests
3.2) MGJ3 for IGBT dV/dt Experimental tests
3.3) MGJ3 for SiC dV/dt Experimental tests
3.4) MGJ6 for IGBT dV/dt Experimental tests
3.5) MGJ6 for SiC dV/dt Experimental tests
3.6) MGJ3/6 for IGBT increased DC link tests
MGJ2 & MGJ3
UNIVERSITY OF NOTTINGHAM - Electrical Systems and Optics Research Division
Phase 1 - DCDC Insulation Degradation
Report – V1.3
Dr. Edward Christopher & Dr. Alan Watson
Please go to 'Downloads' below for the full report.